Last edited by Goltigal
Thursday, August 13, 2020 | History

6 edition of Applied Scanning Probe Methods VII (NanoScience and Technology) found in the catalog.

Applied Scanning Probe Methods VII (NanoScience and Technology)

  • 71 Want to read
  • 34 Currently reading

Published by Springer .
Written in English

    Subjects:
  • Microscopy,
  • Science,
  • Chemistry - Physical & Theoretical,
  • Technology & Industrial Arts,
  • Science/Mathematics,
  • Chemistry - Analytic,
  • Nanotechnology,
  • Physics,
  • Material Science,
  • Nanoscience,
  • Physical Chemistry,
  • Surface Science,
  • Technology / Nanotechnology,
  • Chemistry - General

  • Edition Notes

    ContributionsBharat Bhushan (Editor), Harald Fuchs (Editor)
    The Physical Object
    FormatHardcover
    Number of Pages426
    ID Numbers
    Open LibraryOL9056769M
    ISBN 103540373209
    ISBN 109783540373209

    ISBN: OCLC Number: Description: xlv, pages: illustrations ; 24 cm: Contents: Scanning tunneling microscopy of physisorbed monolayers / Thomas Muller --Tunneling electron spectroscopy towards chemical analysis of single molecules / Tadahiro Komeda --STM studies on molecular assembly at solid/liquid interfaces / Ryo Yamada, Kohei Uosaki --Single . Get this from a library! Applied scanning probe methods VI: characterization. [Bharat Bhushan; Satoshi Kawata;] -- The scanning probe microscopy?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this?eld with an emphasis on technical dev- .

    The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X).Price: $ Full Description: "The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments.

    Buy Applied Scanning Probe Methods III: Characterization Hardback by ISBN: Free postage on orders over £50 to UK and Ireland. No visitors allowed on the premises. Buy Applied Scanning Probe Methods XII: Characterization Hardback by ISBN: Free postage on orders over £50 to UK and Ireland. No visitors allowed on the premises.


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Applied Scanning Probe Methods VII (NanoScience and Technology) Download PDF EPUB FB2

Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications (NanoScience and Technology) Softcover reprint of hardcover 1st ed. Edition : Paperback. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol.

VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method.

In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes.

Applied Scanning Probe Methods VII. The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January and the second to fourth volumes in early The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol.

VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. About this book Introduction The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol.

VIII), characterization (Vol. IX), and biomimetics and industrial. Volumes II, III and IV Applied Scanning Probe Methods VII book the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments.

It constitutes a timely comprehensive overview of SPM applications, now that Cited by: "The focus of this book is recent, practical applications of scanning probe microscopy (SPM).

Because it is written by leading experts in SPM techniques, the book is strongly recommended to those working in the emerging area of nanotechnology. Applied Scanning Probe Methods VII Book   January   with  19 Reads  How we measure 'reads' A 'read' is counted each time someone views a publication summary (such as the title, abstract, and.

Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 8) [Bharat Bhushan, Harald Fuchs, Masahiko Tomitori] on *FREE* shipping on qualifying offers.

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The present volumes cover three main areas: novel probes and techniques (Vol.

V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force.

About this book. The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development.

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments.

Applied Scanning Probe Methods VI Characterization XLVI, p. illus. Hardcover NanoScience and Technology $ ISBN: Volume 7 Bharat Bhushan, The Ohio State University, Columbus, OH, USA; Harald Fuchs, University of Münster, Germany (Eds.) Applied Scanning Probe Methods VIIFile Size: KB.

Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) (v. 3) [Bhushan, Bharat, Fuchs, Harald] on *FREE* shipping on qualifying offers. Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) (v.

3)Format: Hardcover. However, the SEM can record 3D image and movies, features that are not available with the scanning probes. When you read the Applied Scanning Probe Methods II book, all your attention to the subject matter - Try to read minutes before the move, and you will be amazed at how much your focus as soon as you read the book.

The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject.

Beginning with the theoretical background of scanning tunneling microscopy, the design and instrumentation of practical STM and associated 3/5(1). The Paperback of the Applied Scanning Probe Methods VI: Characterization by Bharat Bhushan at Barnes & Noble. FREE Shipping on $35 or more.

Due to COVID, orders may be delayed. Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 5) [Bhushan, Bharat, Fuchs, Harald, Kawata, Satoshi] on *FREE* shipping on qualifying offers. Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v.

5)4/5(1). The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques.

The first volume came out in January and the second to fourth volumes in early The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments.

Get this from a library! Applied scanning probe methods VII: biomimetics and industrial applications. [Bharat Bhushan; H Fuchs;] -- The scanning probe microscopy?eld has been rapidly expanding.

It is a demanding task to collect a timely overview of this?eld with an emphasis on technical dev- opments and industrial applications.Get this from a library! Applied scanning probe methods VII: biomimetics and industrial applications.Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v.

2) [Bhushan, Bharat, Fuchs, Harald] on *FREE* shipping on qualifying offers. Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2)Format: Hardcover.